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Magazine Name : Ieee Design And Test Of Computers

Year : 2001 Volume number : 18 Issue: 01

Using Atomic Force Microscopy For Deep-Submicron Failure Analysis. (Article)
Subject:
Author: Corbet S Johnson      William D Armitage      Jien Chung Lo     
page:      10 - 18
Poirot: Applications Of A Logic Fault Diagnosis Tool. (Article)
Subject:
Author: Srikanth Venkataraman      Brady Drummonds     
page:      19 - 30
Defect-Oriented Testing And Defective-Part-Level Prediction. (Article)
Subject:
Author: Sooryoung Lee      Jason D Wicker      Jannifer Dwarak     
page:      31 - 41
Fault Detection And Location Using Idd Waveform Analysis. (Article)
Subject:
Author: Kaushik Roy     
page:      42 - 49
Ic Diagnosis Using Multiple Supply Pad Iddqs. (Article)
Subject:
Author: Jim Plusquellic     
page:      50 - 62
Modeling A Verifications Test System For Mixed-Signal Circuits. (Article)
Subject:
Author: David San Segundo Bello      Ronald Tongelder     
page:      63 - 71
Hierarchical Atpg For Analog Circuits And Systems. (Article)
Subject:
Author: Jinyan Zhang      Sam Huynh      Mani Huynh     
page:      72 - 81