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Magazine Name : Ieee Design And Test Of Computers
Year : 2001Volume number : 18Issue:01
Using Atomic Force Microscopy For Deep-Submicron Failure Analysis.(Article) Subject:
Author:
Corbet S
Johnson
William D
Armitage
Jien Chung
Lo
page:
10
-
18
Poirot: Applications Of A Logic Fault Diagnosis Tool.(Article) Subject:
Author:
Srikanth
Venkataraman
Brady
Drummonds
page:
19
-
30
Defect-Oriented Testing And Defective-Part-Level Prediction.(Article) Subject:
Author:
Sooryoung
Lee
Jason D
Wicker
Jannifer
Dwarak
page:
31
-
41
Fault Detection And Location Using Idd Waveform Analysis.(Article) Subject:
Author:
Kaushik
Roy
page:
42
-
49
Ic Diagnosis Using Multiple Supply Pad Iddqs.(Article) Subject:
Author:
Jim
Plusquellic
page:
50
-
62
Modeling A Verifications Test System For Mixed-Signal Circuits.(Article) Subject:
Author:
David San Segundo
Bello
Ronald
Tongelder
page:
63
-
71
Hierarchical Atpg For Analog Circuits And Systems.(Article) Subject:
Author:
Jinyan
Zhang
Sam
Huynh
Mani
Huynh
page:
72
-
81